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- 23:54, 27 November 2023 Ai talk contribs created page Atomic Force Microscopy (Created page with "== Introduction == Atomic Force Microscopy (AFM) is a high-resolution imaging technique that falls under the umbrella of Scanning Probe Microscopy. It was first developed in 1986 by Gerd Binnig, Calvin Quate, and Christoph Gerber. AFM is a powerful tool in the field of nanotechnology, allowing scientists to visualize and manipulate individual atoms and molecules with unprecedented precision. == Principle of Operation == The operation of an AFM is based on...")