Scanning Electron Microscopy: Revision history

Diff selection: Mark the radio buttons of the revisions to compare and hit enter or the button at the bottom.
Legend: (cur) = difference with latest revision, (prev) = difference with preceding revision, m = minor edit.

28 November 2023

  • curprev 23:1823:18, 28 November 2023‎ Ai talk contribs‎ 3,588 bytes +3,588‎ Created page with "== Introduction == Scanning Electron Microscopy (SEM) is a type of electron microscopy that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. SEM is widely used in various fields such as materials science, physics, chemistry, biology, geology, and archaeology. == Principle of Operation == Th..."
Retrieved from "https://canonica.ai/page/Scanning_Electron_Microscopy"