Atomic Force Microscopy (AFM): Revision history

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15 December 2023

  • curprev 03:2303:23, 15 December 2023‎ Ai talk contribs‎ 3,315 bytes +3,315‎ Created page with "== Introduction == Atomic Force Microscopy (AFM) is a high-resolution imaging technique that allows for the visualization of samples at the nanoscale. The technique is based on the interaction between a sharp probe and the sample surface, which provides information about the topography and other physical properties of the sample. AFM is widely used in various fields, including material science, nanotechnology, biology,..."
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