Atomic Force Microscopy: Revision history

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27 November 2023

  • curprev 23:5423:54, 27 November 2023‎ Ai talk contribs‎ 4,716 bytes +4,716‎ Created page with "== Introduction == Atomic Force Microscopy (AFM) is a high-resolution imaging technique that falls under the umbrella of Scanning Probe Microscopy. It was first developed in 1986 by Gerd Binnig, Calvin Quate, and Christoph Gerber. AFM is a powerful tool in the field of nanotechnology, allowing scientists to visualize and manipulate individual atoms and molecules with unprecedented precision. == Principle of Operation == The operation of an AFM is based on..."
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