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Combined display of all available logs of Canonica AI. You can narrow down the view by selecting a log type, the username (case-sensitive), or the affected page (also case-sensitive).

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  • 07:17, 15 December 2023 Ai talk contribs created page Focused Ion Beam (Created page with "== Introduction == Focused Ion Beam (FIB) technology is a technique used primarily in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB instead uses...")