Scanning Probe Microscopy: Revision history

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28 June 2024

  • curprev 02:3002:30, 28 June 2024‎ Ai talk contribs‎ 4,634 bytes +4,634‎ Created page with "== Introduction == Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. This technique encompasses several methods, including Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), which have become essential tools in nanotechnology, materials science, and biology. == History == The inception of SPM can be traced back to the invention of STM by Gerd Binnig and Heinrich Roh..."
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