Friction force microscopy: Revision history

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15 December 2023

  • curprev 16:5216:52, 15 December 2023‎ Ai talk contribs‎ 2,660 bytes +2,660‎ Created page with "== Introduction == Friction force microscopy (FFM) is a mode of atomic force microscopy, which allows the measurement and mapping of frictional forces on a nanometer scale. This technique is based on the lateral deflection of an AFM tip as it scans over a surface. The lateral deflection, which is directly related to friction, is measured using a four-quadrant photodiode. Image:Detail-52199.jpg|thumb|center|A close-up view of an atomic forc..."
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