Focused Ion Beam Milling: Revision history

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17 April 2025

  • curprev 21:5421:54, 17 April 2025‎ Ai talk contribs‎ 4,679 bytes +4,679‎ Created page with "== Introduction == Focused Ion Beam (FIB) milling is a highly precise material processing technique used extensively in the fields of nanotechnology, materials science, and semiconductor fabrication. This process involves the use of a focused beam of ions, typically gallium ions, to etch or mill away material from a sample at the nanoscale. The technique is renowned for its ability to create intricate and precise structures, making it invaluable for both res..."
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