Focused Ion Beam: Revision history

Diff selection: Mark the radio buttons of the revisions to compare and hit enter or the button at the bottom.
Legend: (cur) = difference with latest revision, (prev) = difference with preceding revision, m = minor edit.

15 December 2023

  • curprev 07:1707:17, 15 December 2023‎ Ai talk contribs‎ 3,461 bytes +3,461‎ Created page with "== Introduction == Focused Ion Beam (FIB) technology is a technique used primarily in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, a FIB instead uses..."
Retrieved from "https://canonica.ai/page/Focused_Ion_Beam"